JEM-ARM300F2 transmission electron microscope offers state-of-the-art sub-angstrom imaging and analysis for both light and heavy elements. Operating at 40–300 kV, it features a cold field emission gun with enhanced coherence, brightness, and stability. Compatible techniques include HRTEM, EFTEM, STEM HAADF/BF/OBF, EDS/EELS mapping, and 4D-STEM. An electrostatic dose controller enables atomic-scale analysis of beam-sensitive materials. In situ holders allow real-time characterization under cryogenic, high-temperature, and electric field conditions.

JEM-F200 field emission transmission electron microscope is a versatile instrument for nanoscale structural and physical property analysis in materials science. It operates at an accelerating voltage of 200/80 kV and is equipped with a cold field emission gun, offering excellent coherence, brightness, and stability. The system supports HRTEM, STEM HAADF/BF imaging, and EDS mapping. Combined with in situ cryogenic electrical holders and in situ thermal-electrical holders, it enables real-time characterization of material structures at the nanoscale under external fields such as low/high temperatures and applied voltages.

The Solaris Cryo-FIB/SEM dual-beam system integrates cryogenic sample preparation, focused ion beam milling, and electron beam imaging. Equipped with a Quorum PP3010 cryo-stage and transfer system, it enables cryo-TEM sample preparation and 3D reconstruction under cryogenic conditions. EDS and EBSD attachments support compositional and crystallographic analysis. The system also allows in situ cryo-mechanical testing, making it a powerful platform for cryo-EM, structural biology, and nanoscale materials research.